Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2012] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [Japanese] / [English]
R2015-56
Reliability Analysis Based on Hierarchical Bayesian Models and Filtering Methodologies
Toru Kaise (Univ. of Hyogo)
pp. 1 - 4
R2015-57
A Measurement Method for the Extent of Simultaneous Soft Errors
Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba)
pp. 5 - 10
R2015-58
Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping
Koichi Endo (Toshiba Corp.), Tomonori Nakamura (Hamamatsu Photonics K.K.), Koji Nakamae (Osaka Univ.)
pp. 11 - 16
R2015-59
A reliability test planning of electronic components for assurance of quality
Toshinari Matsuoka (Mitsubishi Electric)
pp. 17 - 22
R2015-60
A Study on acceleration test for Life-End Evaluation
Sadanori Ito (ITOKEN)
pp. 23 - 26
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.