Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2012] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [Japanese] / [English]
MW2015-87
An estimation of third order PIM using one continuous wave
Kunihiro Kawai, Atsushi Fukuda, Yuta Takagi, Hiroshi Okazaki, Shoichi Narahashi (NTT DOCOMO)
pp. 1 - 8
MW2015-88
New Expression of Loss in LC Circuts
Kyohei Yamada, Naoki Sakai, Takashi Ohira (TUT)
pp. 9 - 12
MW2015-89
[Invited Lecture]
Large Array Antennas for the 60 GHz-Band Compact-Range Wireless Access System
Miao Zhang, Jiro Hirokawa, Makoto Ando (Tokyo Tech.)
pp. 13 - 17
MW2015-90
[Invited Lecture]
RF front-end configuration of Massive-MIMO base station
Yasunori Suzuki, Kei Satoh, Makoto Sumi, Atsushi Fukuda, Shoichi Narahashi (NTT DOCOMO)
pp. 19 - 23
MW2015-91
[Invited Lecture]
A Study on an RF equipment of a massive MIMO base station using highly integrated RF front-end MMICs
Yo Yamaguchi, Takana Kaho, Tadao Nakagawa (NTT)
pp. 25 - 28
MW2015-92
[Fellow Memorial Lecture]
Linear Passive Reciprocal Two-Port Systems as Viewed from kQ Product Perspective
Takashi Ohira (Toyohashi Univ Tech)
pp. 29 - 30
MW2015-93
[Memorial Lecture]
Basic Study on Bandpass Filters using Hybridmode Resonator
Masaya Tamura (TUT)
pp. 31 - 34
MW2015-94
[Invited Lecture]
Path Loss Characteristics from 0.8 GHz and 37 GHz Bands in Indoor Office Environment
Motoharu Sasaki, Minoru Inomata, Wataru Yamada, Takeshi Onizawa, Masashi Nakatsugawa (NTT)
pp. 35 - 40
MW2015-95
[Invited Lecture]
Optical antenna system for short range ultra high speed communication
Hiroyuki Arai (YNU)
pp. 41 - 44
MW2015-96
A Study on Characteristics of Microwave Lossy Resonators
-- Investigations for the resonator method to evaluate dielectric materials --
Daiki Endo, Takashi Shimizu, Yoshinori Kogami (Utsunomiya Univ.)
pp. 45 - 48
MW2015-97
An experimental study on the influence of humidity in measurements of the millimeter wave complex permittivity
Hiroki Tsuchiya, Naoki Yamada, Takashi Shimizu, Yoshinori Kogami (Utsunomiya Univ.)
pp. 49 - 54
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.