Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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OME2012-32
[Special Invited Talk]
Fifty Years of Semiconductor Lasers
Yasuharu Suematsu (Tokyo Inst. of Tech./Takayanagi Memorial Foundation)
pp. 1 - 6
OME2012-33
Electronic properties of ZnO thin films grown on a-sapphire substrates using high-energy H2O generated by a catalytic reaction
-- Analysis using a two layer model --
Eichi Nagatomi, Naoya Yamaguchi, Takahiro Kato (Nagaoka Univ. Technol.), Hironobu Umemoto (Shizuoka Univ.), Kanji Yasui (Nagaoka Univ. Technol.)
pp. 7 - 11
OME2012-34
Characteristics of ZnO films grown on glass substrates using high-energy H2O generated by a catalytic reaction
-- Effect of a sputter deposited buffer layer --
Takahiro Oyanagi, Souichi Satomoto, Kai Sato, Takahiro Kato (Nagaoka Univ. Technol.), Hironori Katagiri, Kazuo Jimbo (Nagaoka Nat. College Technol.), Kanji Yasui (Nagaoka Univ. Technol.)
pp. 13 - 18
OME2012-35
Crystalline Oxide Thin Film Fabrication Using Crystal Contact Epitaxy Technique
Satoru Noge, Kentaro Konishi (Numazu NCT)
pp. 19 - 22
OME2012-36
Growth and Shape Control of ZnO Nanorods by Chemical Bath Deposition Using ZnCl2 as a Source Material
Tomoaki Terasako, Toshihiro Murakami (Grad. Scool Sci. & Eng., Ehime Univ.), Masakazu Yagi (Kagawa Nat. Coll. Technol.), Sho Shirakata (Grad. Scool Sci. & Eng., Ehime Univ.)
pp. 23 - 28
OME2012-37
Dual Bimorph-Driven Actuator
Hiroki Maruyama, Yuki Hosoda, Noriko Bamba, Tatsuo Fukami (Shinshu Univ.)
pp. 29 - 33
OME2012-38
Sensitivity enhancement in passive intermodulation measurements for printed circuit boards
Kensuke Saito, Daijiro Ishibashi, Nobuhiro Kuga (Yokohama Nat'l Univ.)
pp. 35 - 39
OME2012-39
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the oscillating mechanism(22) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
pp. 41 - 46
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.