Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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AP2011-199
Antenna Design for Multi-User MIMO to be Robust against Channel Feedback Error
Hajime Nakamichi, Maki Arai, Kei Sakaguchi, Kiyomichi Araki (Tokyo Tech), Takayuki Sotoyama (Panasonic Mobile Communications), Masayuki Hoshino (Panasonic)
pp. 1 - 6
AP2011-200
Proposal on Shadow Fading Generation Model Based on Wavelet Transform
Tetsuro Imai (NTT DOCOMO)
pp. 7 - 12
AP2011-201
Experimental study on multi-point wireless energy transmission at 950MHz band
Daiki Maehara, Kei Sakaguchi, Kiyomichi Araki (Tokyo Tech.), Takehiro Miyamoto, Minoru Furukawa, Tadashi Shirato (DENGYO)
pp. 13 - 17
AP2011-202
[Tutorial Lecture]
Why are antennas folded?
Hisashi Morishita (NDA)
pp. 19 - 24
AP2011-203
Correlation Suppression Performance of Spatial Smoothing Preprocessing at a Transmitter for DOA Estimation of Wide-band Signals
Kyouhei Maeda, Toshihiko Nishimura, Yasutaka Ogawa, Takeo Ohgane (Hokkaido Univ.)
pp. 25 - 30
AP2011-204
A Study on Path Shadowing Model due to Human Activities in Outdoor to Indoor Radio Propagation Environments
Tokio Taga (Kwansei Gakuin Univ.), Tetsuro Imai (NTT docomo)
pp. 31 - 36
AP2011-205
Investigation on the relation between MIMO channel capacity and the total received power of a multibeam antenna
Kenichi Kagoshima (Ibaraki Univ.), Shigeki Takeda, Kazuki Nishimura, Kouhei Itou (baraki Univ.)
pp. 37 - 42
AP2011-206
Active Tapping Approach against Wireless Secret Key Sharing System
Katsuhiro Fujiki, Tadafumi Yoshida, Takafumi Saito, Naoki Sakai, Hideyuki Uehara, Takashi Ohira (Toyohashi Tech)
pp. 43 - 48
AP2011-207
Front-Back Switching H-Shaped ESPAR Antenna
Yuki Takatani, Yasuaki Oda, Yuki Kikuchi, Shota Mori, Naoki Sakai, Hideyuki Uehara, Takashi Ohira (Toyohashi Tech)
pp. 49 - 54
AP2011-208
Extraction of Equivalent Anisotropic Material Property of Periodically Arranged Dummy Metal Fills in a CMOS chip
Takuichi Hirano, Kenichi Okada, Jiro Hirokawa, Makoto Ando (Tokyo Tech)
pp. 55 - 60
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.