IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 111, Number 354

Reliability

Workshop Date : 2011-12-16 / Issue Date : 2011-12-09

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Table of contents

R2011-37
Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST)
pp. 1 - 7

R2011-38
Metal corrosion process under coating and reliability analysis
Hiroyuki Saito, Norihiro Fujimoto, Takashi Sawada, Yosuke Takeuchi (NTT)
pp. 9 - 13

R2011-39
Replication Node Assignments Minimizing the Load of Read Access in File Versioning Protocol
Satoshi Fukumoto, Mamoru Ohara (Tokyo Metropolitan Univ.), Mitsuhiro Kimura (Hosei Univ.)
pp. 15 - 19

R2011-40
A Trend of Optimal Arrangements in a Multi-state Consecutive-k-out-of-n:F system
Tomoaki Akiba (Yamagata-CIT), Hisashi Yamamoto, Hideki Nagatsuka (Tokyo Metro. Univ.)
pp. 21 - 26

R2011-41
A generalization of metrics-based software reliability models
Yusuke Etani, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 27 - 32

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan