Print edition: ISSN 0913-5685
[TOP] | [2006] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [Japanese] / [English]
VLD2006-34 VLD2006-39
A Processor for Genetic Algorithm using Dynamically Reconfigurable Memory
Akihiko Tsukahara, Akinori Kanasugi (Tokyo Denki Univ.)
pp. 1 - 6
VLD2006-35 VLD2006-40
To be announced
Yoshio Ashizawa, Hideki Oka (FUJITSU LABORATORIES)
pp. 7 - 12
VLD2006-36 VLD2006-41
Global Identification of Variability Factors and Its Application to the Statistical Worst-Case Model Generation
Katsumi Eikyu, Takeshi Okagaki, Motoaki Tanizawa, Kiyoshi Ishikawa, Osamu Tsuchiya (Renesas)
pp. 13 - 18
VLD2006-37 VLD2006-42
Modeling of Discrete Dopant Effects on Threshold Voltage Shift by Random Telegraph Signal
Ken'ichiro Sonoda, Kiyoshi Ishikawa, Takahisa Eimori, Osamu Tsuchiya (Renesas Technology Corp.)
pp. 19 - 24
VLD2006-38 VLD2006-43
Improvement of Drive Current in Bulk-FinFET using Full 3D Process/Device Simulations
Takahisa Kanemura, Takashi Izumida, Nobutoshi Aoki, Masaki Kondo, Sanae Ito, Toshiyuki Enda, Kimitoshi Okano, Hirohisa Kawasaki, Atsushi Yagishita, Akio Kaneko, Satoshi Inaba, Mitsutoshi Nakamura, Kazunari Ishimaru, Kyoichi Suguro, Kazuhiro Eguchi (Toshiba Corp.)
pp. 25 - 29
VLD2006-44
To be announced
Yoshimasa Yoshioka, Yasuhisa Omura (Kansai Univ.)
pp. 31 - 36
VLD2006-45
A Novel Asymmetric Raised Source/Drain Extension Structure for 32nm-node MOSFETs
-- An ultimate planar MOSFET --
Tsutomu Imoto, Yasushi Tateshita, Toshio Kobayashi (SONY)
pp. 37 - 42
VLD2006-46
To be announced
Tsuyoshi Yamamura, Shingo Sato, Yasuhisa Omura (Kansai Univ.)
pp. 43 - 48
VLD2006-47
To be announced
Hideaki Tsuchiya, Kazuya Fujii, Takashi Mori, Tanroku Miyoshi (Kobe Univ.)
pp. 49 - 54
VLD2006-48
To be announced
Hideki Minari, Nobuya Mori (Osaka Univ.)
pp. 55 - 58
VLD2006-49
Quantum Electron Transport Modeling in Nano-Scale Devices Based on Multiband Non-Equilibrium Green's Funtion Method
Helmy Fitriawan, Satofumi Souma, Matsuto Ogawa, Tanroku Miyoshi (Kobe Univ.)
pp. 59 - 63
VLD2006-50
To be announced
Masami Hane, Takeo Ikezawa, Michihito Kawada (NEC), Tatsuya Ezaki (Hiroshima Univ.), Toyoji Yamamoto (MIRAI-ASET)
pp. 65 - 69
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.