{"id":477,"date":"2023-12-30T09:37:14","date_gmt":"2023-12-30T00:37:14","guid":{"rendered":"https:\/\/www.ieice.org\/shikoku\/?p=477"},"modified":"2023-12-30T09:37:14","modified_gmt":"2023-12-30T00:37:14","slug":"post-477","status":"publish","type":"post","link":"https:\/\/www.ieice.org\/shikoku\/news\/post-477\/","title":{"rendered":"1\u670816\u65e5\u958b\u50ac\u3000\u8b1b\u6f14\u4f1a\u306e\u304a\u77e5\u3089\u305b"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\">\u65e5\u3000\u6642\uff1a2024\u5e741\u670816\u65e5\uff08\u706b\uff0913:30\u301c14:30<br>\u4f1a\u3000\u5834\uff1a\u9ad8\u77e5\u5de5\u79d1\u5927\u5b66\u9999\u7f8e\u30ad\u30e3\u30f3\u30d1\u30b9\u3000\u6559\u80b2\u7814\u7a76\u68dfA103<br>\u984c\u3000\u76ee\uff1aIntroduction to Analysis and Debugging of Transient Faults<br>\u8b1b\u3000\u5e2b\uff1aNational Tsing Hua University, Department of Electrical Engineering<br>                  Professor Jing-Jia Liou<br>\u6982\u3000\u8981\uff1aTransient fault is an error model that flips a register or memory bit at certain cycles of a digital circuit, e.g, a processor core. The model is\u00a0commonly applied in evaluating the reliability of a digital system including both software and hardware. For example, we may inject sampled\u00a0transient faults and run a software to observe the hardware faulty behavior, so error outputs can be analyzed and mitigated. On the other hand,\u00a0when a system captures and shows error symptom during validation, a debugging process will often start with tracing the root cause to a certain\u00a0transient fault and then follow up with failure analysis. For both above applications, we face the issue that the number of transient faults is\u00a0simply too large for a full comprehensive analysis. In this talk, we will introduce and discuss methods on how to analyze and reduce the number\u00a0of transient faults. In our experiments with two RISC-V cores, only under 1-3% of faults remains necessary for processing, which can drastically\u00a0improve our reliability analysis for a digital system.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u65e5\u3000\u6642\uff1a2024\u5e741\u670816\u65e5\uff08\u706b\uff0913:30\u301c14:30\u4f1a\u3000\u5834\uff1a\u9ad8\u77e5\u5de5\u79d1\u5927\u5b66\u9999\u7f8e\u30ad\u30e3\u30f3\u30d1\u30b9\u3000\u6559\u80b2\u7814\u7a76 [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":"","_wp_rev_ctl_limit":""},"categories":[2],"tags":[],"class_list":["post-477","post","type-post","status-publish","format-standard","hentry","category-news"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/posts\/477","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/comments?post=477"}],"version-history":[{"count":0,"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/posts\/477\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/media?parent=477"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/categories?post=477"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ieice.org\/shikoku\/wp-json\/wp\/v2\/tags?post=477"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}