International Symposium on Antennas and Propagation
Design Concept of the EMI Noises Surveying System for Transceivers Performance-Based Test
Hsuang-Chung Ko, Deng-Yao Chang, Cheng-Nan Hu,
PDF download (187.5KB)
Emerging wireless SOC and SIP technologies with highly integrated devices derive the developmentoftoday’slow costwirelessmobileterminalswithmulti-standards, including GSM/EDGE, Bluetooth/WLAN, GPS, and UMTS/WCDMA system, on a single convergent platform . When conducting the RF performance measurement, RF test development has always been torn between the request to be able to perform a large variety of sophisticated RF measurements in a productive environment and the restriction to keep cost of test as low as possible. Considering the ATE system, the most costly and complex components are those used in RF subsystem, which is usually configured to handle only one receiver per system. These receivers must handle a frequency range between 10 MHz and 6 GHz and have a very high dynamic range capable of measuring stringent two-tone signals such as Adjacent Channel Power Ratio (ACPR) or Third Order Intercept (IP3). These signals are difficult to measure because they consist of a primary high power frequency or tone at 900 MHz to 6 GHz, which is adjacent to a very low-level noise tones 10 MHz away under the requirement of the measured repeatable to 0.1 dB accuracy [2-4]. As a result, the high susceptibility of the Device-Under-Test (DUT) to electromagnetic noise from its immediate surroundings is a key issue. Thus, an approach to survey the surrounding electromagnetic interferences on wireless systems is essentially important to an ATE during performing the performance-based test to come out the repeatable and confident measured results. In this paper, we firstly propose a cost-effect test-bench design concept in which a PCB antenna system featured by the multi-band, dual-polarized radiated performance is utilized to measure the environment electromagnetic noises. Instead of the unuser-friendly metal-shielding environment or expensive chamber room solutions, by incorporating into this design concept, the novel ATE can be used to clarify the root-cause and to improve the low yields issue when performing RF testing suspected by EMI interferences.