Summary

International Symposium on Antennas and Propagation

2004

Session Number:1C2

Session:

Number:1C2-1

MEASUREMENT OF DIELECTRIC CONSTANT AND CONDUCTIVITY OF SILICON WAFERS AT MICROWAVE FREQUENCIES USING A FREE-SPACE METHOD

Noor H. Baba,  

pp.125-128

Publication Date:2004/8/18

Online ISSN:2188-5079

DOI:10.34385/proc.12.1C2-1

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