Summary

International Symposium on Electromagnetic Compatibility

2004

Session Number:3C1

Session:

Number:3C1-1

Equivalent circuit expression of dual TEM cell apparatus for shielding material evaluation

A. Nishikata,  R. Saito,  Y. Yamanaka,  

pp.609-612

Publication Date:2004/6/1

Online ISSN:2188-5079

DOI:10.34385/proc.11.3C1-1

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