Summary

International Symposium on Electromagnetic Compatibility

2004

Session Number:3A1

Session:

Number:3A1-2

Three-wire analysis model to predict SI and EMC effects

E. Engin,  

pp.485-488

Publication Date:2004/6/1

Online ISSN:2188-5079

DOI:10.34385/proc.11.3A1-2

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