Summary
International Symposium on Electromagnetic Compatibility
2009
Session Number:23Q1
Session:
Number:23Q1-3
A Concurrent Engineering Platform for Modeling IC Emission and Immunity
A. C. Ndoye, A. Boyer, E. Sicard, S. Serpaud, F. Lafon,
pp.529-532
Publication Date:2009/7/20
Online ISSN:2188-5079
Summary:
The emergence of integrated circuits is increasingly more complex associated with the growth of the problems involved in the immunity and the emissions of these same components give the need for a model of susceptibility or emission. This model must be not only be used by the manufacturers of circuits to check if their components will pass EMC specifications, but also by the industries to evaluate the emission and the immunity of their products. The development of this model represents a true challenge since this one must be accurate enough, compatible with the simulation flow suggested by the most current tools and to include only non-confidential data. The LATTIS laboratory [1] of INSA Toulouse has implemented for a few years an Electromagnetic Compatibility (EMC) platform of the components which concentrates at the same time the means of EMC measurement of components and the means of modeling. The more innovating aspects concern the modeling part with, in particular, the development of an experimental platform IC-EMC [2] which capitalizes the knowledge, to make acquired in modeling of emission and immunity components. The platform is currently in the phase of validation and used in the EMC component research with industrial partnership.