Summary
International Symposium on Electromagnetic Compatibility
2009
Session Number:22P2
Session:
Number:22P2-2
Integrated EM Immunity Design and Diagnosis System for Electronic Devices
X. K. Gao,
pp.329-332
Publication Date:2009/7/20
Online ISSN:2188-5079
Summary:
Appropriate EMC computer design techniques are required nowadays for EMC problems mitigation, based on qualitative and quantitative assessments of the reasonably foreseeable worst-case EM and physical environments over the lifetime of electronic systems, to enable the systems to have higher EM noise immunity level and lower radiation characteristics. An integrated electromagnetic immunity design and diagnosis system for EMI/EMC scenarios assessment and analysis is thus proposed. The system allows modeling of the associated physical problems to be conveniently made and fast evaluation of the EMC performance to be obtained. The object classes required for electromagnetic problems analysis have been defined within the system. The Computational EM techniques based hybrid methodology, which integrates the analytical technology and numerical methods, will be developed in the system to solve real life EMC problems and provide the inspection and prediction of results, such as conducted/radiated emission, conducted/radiated immunity, from the interim and final design. The experimental validation approach is to verify the modeling technology performance and providing the strategic design guidelines for applying the EMC methodologies and techniques in the physical system design. EMC standards and specifications, and EMC challenging and benchmark problems will be integrated in the system ultimately.