Summary

International Technical Conference on Circuits/Systems, Computers and Communications

2016

Session Number:T3-2

Session:

Number:5150

Validating Log-normal Distribution of Delay Variability in Near-Threshold Design

Kwangsu Kim,  Sangwoo Han,  Young Min Park,  Minyoung Im,  Eui-Young Chung ,  

pp.601-604

Publication Date:2016/7/10

Online ISSN:2188-5079

DOI:10.34385/proc.61.5150

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Summary:
In this work, we perform an in-depth exploration on variability of standard cells operating at near-threshold voltage. Log-normal distribution model displays a very accurate result out of the box,i.e. without further fitting algorithm, although it also yields high error in high-slew conditions and in slew error. We also show that the accuracy of calculated 3 sigma/mean varies with different input slew values. While log-normal modeling is promising, a better fitting methodology is required to overcome its inconsistency in order to adapt to commercial EDA flow.