Summary
International Technical Conference on Circuits/Systems, Computers and Communications
2016
Session Number:T3-2
Session:
Number:5150
Validating Log-normal Distribution of Delay Variability in Near-Threshold Design
Kwangsu Kim, Sangwoo Han, Young Min Park, Minyoung Im, Eui-Young Chung ,
pp.601-604
Publication Date:2016/7/10
Online ISSN:2188-5079
DOI:10.34385/proc.61.5150
PDF download (1MB)
Summary:
In this work, we perform an in-depth exploration on variability of standard cells operating at near-threshold voltage. Log-normal distribution model displays a very accurate result out of the box,i.e. without further fitting algorithm, although it also yields high error in high-slew conditions and in slew error. We also show that the accuracy of calculated 3 sigma/mean varies with different input slew values. While log-normal modeling is promising, a better fitting methodology is required to overcome its inconsistency in order to adapt to commercial EDA flow.