Summary
International Technical Conference on Circuits/Systems, Computers and Communications
2016
Session Number:M2-2
Session:
Number:M2-2-5
Evaluation of Threshold Voltage Extraction Methods in Deep-submicron Technology
Tae Hyun Kim, Hanwool Jeong, Seong-Ook Jung ,
pp.155-158
Publication Date:2016/7/10
Online ISSN:2188-5079
Summary:
Old equations for threshold voltage aren't suitable for short channel devices in thesedays. As an alternative of these equations, various medthods are devised to extract the threshold voltage from drain current versus gate voltage characteristic. This paper compares these methods with technology scaling in deep-submicrom technology and evluates which method is suitable