number | title/author |
---|---|
E1-1 | Open Lead Detection Based on Logical Change Caused by AC Voltage Signal Stimulus Akira Ono, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masao Takagi, Masaki Hashizume, |
E1-2 | Flexible Multi-IP Verification Methodology Based on an FPGA Platform Jin Woo Song, Ki-Seok Chung, |
E1-3 | Fault Analysis of Interconnect Opens in 90nm CMOS ICs with Device Simulator Masaki Hashizume, Yuichi Yamada, Hiroyuki Yotsuyanagi, Toshiyuki Tsutsumi, Koji Yamazaki, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu, |
E1-4 | Virtual ARM Simulation Platform for Embedded System Developers Alex Heunhe Han, Young-Ho Ahn, Ki-Seok Chung, |