The 23rd International Technical Conference on Circuits/Systems, Computers and Communications

number title/author
E1-1Open Lead Detection Based on Logical Change Caused by AC Voltage Signal Stimulus
Akira Ono, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masao Takagi, Masaki Hashizume,
E1-2Flexible Multi-IP Verification Methodology Based on an FPGA Platform
Jin Woo Song, Ki-Seok Chung,
E1-3Fault Analysis of Interconnect Opens in 90nm CMOS ICs with Device Simulator
Masaki Hashizume, Yuichi Yamada, Hiroyuki Yotsuyanagi, Toshiyuki Tsutsumi, Koji Yamazaki, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu,
E1-4Virtual ARM Simulation Platform for Embedded System Developers
Alex Heunhe Han, Young-Ho Ahn, Ki-Seok Chung,