2009 International Symposium on Electromagnetic Compatibility, Kyoto

number title/author
23S3-1Estimate Method of Wideband Transition Duration Due to Micro Gap Discharge Using a Transmission Loss of High Performance Semi-Rigid Coaxial Line
K. Kawamata, S. Minegishi, Y. Taka,
23S3-2Measurement of Induced Voltages on Simple Printed Circuit Board Due to Indirect Discharges of ESD Generators
N. Yamamoto, Y. Taka, O. Fujiwara,
23S3-3Immunity Estimation to Electrostatic Discharge by Circuit Simulation and Conducted Immunity Measurement of Ics
Y. Shiraki,
23S3-4Practical Evaluation of ESD Protection Devices for High-Speed Interface
K. Yoshioka,