number | title/author |
---|---|
15P1-A1 | The Advantages of Spatial Domain Probe Compensation Technique in EMC Near-Field Measurements Martin Schmidt, Manfred Albach, |
15P1-A2 | Automated EMC/EMI Near-Field Testbed Sven Kuehn, Niels Kuster, Martin Wild, Eugene Grobbelaar, Peter Sepan, Beyhan Kochali, Andreas Fuchs, Jan Lienemann, |
15P1-A3 | Study on the Measurement of Microscopic RF Field Distribution with a MFM Tip Exploiting a Beat Signal Between a CPW and an Exciting Coil Yasushi Endo, Masaki Onishi, Masaaki Fukushima, Kaoru Arai, Kunio Yanagi, Yutaka Shimada, Masahiro Yamaguchi, |
15P1-A4 | Measurement of Complex Near Mgnetic Fields by Using 6-port Network Masashi Kawakami, Takayuki Nambu, Kimitoshi Murano, Yoshio Kami, Fengchao Xiao, |