2014 International Symposium on Electromagnetic Compatibility, Tokyo

number title/author
15P1-A1The Advantages of Spatial Domain Probe Compensation Technique in EMC Near-Field Measurements
Martin Schmidt, Manfred Albach,
15P1-A2Automated EMC/EMI Near-Field Testbed
Sven Kuehn, Niels Kuster, Martin Wild, Eugene Grobbelaar, Peter Sepan, Beyhan Kochali, Andreas Fuchs, Jan Lienemann,
15P1-A3Study on the Measurement of Microscopic RF Field Distribution with a MFM Tip Exploiting a Beat Signal Between a CPW and an Exciting Coil
Yasushi Endo, Masaki Onishi, Masaaki Fukushima, Kaoru Arai, Kunio Yanagi, Yutaka Shimada, Masahiro Yamaguchi,
15P1-A4Measurement of Complex Near Mgnetic Fields by Using 6-port Network
Masashi Kawakami, Takayuki Nambu, Kimitoshi Murano, Yoshio Kami, Fengchao Xiao,