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The 31st International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2016)
| number | title/author |
|---|---|
| M3-2-1 | A Built-in Test Circuit for Injected Charge Tests of Open Defects in CMOS ICs Kouhei Ohtani, Daisuke Suga, Hiroyuki Yotsuyanagi, Masaki Hashizume , |
| M3-2-2 | A Built-in Test Circuit to Monitor Changing Process of Resistive Open Defects in 3D ICs Masashi Okamoto, Akihiro Odoriba, Hiroyuki Yotsuyanagi, Masaki Hashizume, Shyue-Kung Lu , |
| M3-2-3 | Random Forest Model for Silicon-to-SPICE Gap and FinFET Design Attributes Identification Hyosig Won, Katsuhiro Shimazu , |
| M3-2-4 | Moisture-Insensitive Low-Concentration Oxidizing-Gas Sensor Taku Horiguchi, Yoshiki Sasaki, Katsutoshi Saeki , |
| M3-2-5 | FPGA-Based Educational System Cooperating with Mobile Applications for Learning Computer Architecture Hiroyuki Maeda, Yoshihiro Yasutake, Azumi Iihoshi, Koichiro Tanaka , |