Presentation 2015-02-05
Sensitivity Improvement in Refractive Index Measurement by Photodiode with Surface Plasmon Antenna
Hiroaki SATOH, Shohei IWATA, Atsushi ONO, Hiroshi INOKAWA,
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Abstract(in English) The refractive index (RI) measurement using our proposed photodiode with surface plasmon antenna can be performed simply by the light illumination to the sensor chip, and can easily realize the simultaneous detections, when a large number of photodiodes is integrated on the chip. These unique characteristics contribute to the high-throughput analysis for the intermolecular interactions of analyte without relying on fluorescence label. This report demonstrates the improved sensitivity for the analyte RI change by the newly proposed measurement method using the laser light source with single wavelength. Based on the results, the noise equivalent RI change per unit bandwidth less than 10^<-6> RIU (refractive index unit) is expected.
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Keyword(in English) Biosensor / refractive index measurement / surface plasmon antenna / SOI photodiode
Paper # ED2014-142,SDM2014-151
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Committee SDM
Conference Date 2015/1/29(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Sensitivity Improvement in Refractive Index Measurement by Photodiode with Surface Plasmon Antenna
Sub Title (in English)
Keyword(1) Biosensor
Keyword(2) refractive index measurement
Keyword(3) surface plasmon antenna
Keyword(4) SOI photodiode
1st Author's Name Hiroaki SATOH
1st Author's Affiliation Graduate School of Engineering, Shizuoka University:Research Institute of Electronics, Shizuoka University()
2nd Author's Name Shohei IWATA
2nd Author's Affiliation Research Institute of Electronics, Shizuoka University
3rd Author's Name Atsushi ONO
3rd Author's Affiliation Graduate School of Engineering, Shizuoka University:Research Institute of Electronics, Shizuoka University
4th Author's Name Hiroshi INOKAWA
4th Author's Affiliation Graduate School of Engineering, Shizuoka University:Research Institute of Electronics, Shizuoka University
Date 2015-02-05
Paper # ED2014-142,SDM2014-151
Volume (vol) vol.114
Number (no) 443
Page pp.pp.-
#Pages 5
Date of Issue