| Presentation | 2015-02-13 A Simulated Annealing based LowIR Drop Pattern Selection Method for Resistive Open Fault Diagnosis S Wang, Taiga Inoue, T. Al-Awadhi Hanan, Yoshinobu Higami, Hiroshi Takahashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Resistive Open Faults (RoF) are known to be major sources of small delays in Deep Sub-Micron devices. Excessive IR drop during test results in delay variation that would cause incorrect diagnosis for small delay faults such as RoFs. We believe that the patterns with low IR drop can help avoid incorrect diagnosis. Therefore, we propose a test pattern selection method for RoF diagnosis under the constraint of low IR drop. Our method first selects the patterns for target faults whose longest sensitized path have high IR drop from a pre-generated test set, and then it conducts x-identification and x-filling on the risky pattern set to generate safety patterns with low IR drop for the target faults. Simulated Annealing algorithm is introduced for exploring the best x-filling. Experimental results show the effectiveness of our selection. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | resistive open fault / IR drop / diagnosis test generation / X-filling / simulated annealing |
| Paper # | DC2014-87 |
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| Committee | DC |
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| Conference Date | 2015/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Simulated Annealing based LowIR Drop Pattern Selection Method for Resistive Open Fault Diagnosis |
| Sub Title (in English) | |
| Keyword(1) | resistive open fault |
| Keyword(2) | IR drop |
| Keyword(3) | diagnosis test generation |
| Keyword(4) | X-filling |
| Keyword(5) | simulated annealing |
| 1st Author's Name | S Wang |
| 1st Author's Affiliation | Ehime University() |
| 2nd Author's Name | Taiga Inoue |
| 2nd Author's Affiliation | Ehime University |
| 3rd Author's Name | T. Al-Awadhi Hanan |
| 3rd Author's Affiliation | Ehime University |
| 4th Author's Name | Yoshinobu Higami |
| 4th Author's Affiliation | Ehime University |
| 5th Author's Name | Hiroshi Takahashi |
| 5th Author's Affiliation | Ehime University |
| Date | 2015-02-13 |
| Paper # | DC2014-87 |
| Volume (vol) | vol.114 |
| Number (no) | 446 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |