Presentation | 2015-02-13 A Method of LFSR Seed Generation for Hierarchical BIST Kosuke SAWAKI, Satoshi OHTAKE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A linear feedback shift register (LFSR) is used as a test pattern generator of built-in self-test (BIST). In BIST, although pseudo-random patterns generated by the LFSR are applied to a circuit under test (CUT) as test patterns, reseeding, which replaces the seed of the LFSR, is used to detect random pattern resistant faults (RPRFs). In general, a seed that when expanded by the LFSR will produce a test pattern for an RPRF is used for reseeding. So far, we have proposed a one-pass seed generation method for generating such a seed for scan based BIST. In this paper, we employ the concept of the one-pass seed generation for hierarchical BIST methods utilizing register-transfer level (RTL) information. The proposed method can identify untestable faults under the BIST environment and guarantees to generate seeds for detectable faults. In our experiments for several RTL benchmark circuits, we show that fault coverage can be improved by using the generated seeds for RPRFs of the circuits. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | BIST / LFSR / seed generation / time expansion model / delay faults / hierarchical BIST |
Paper # | DC2014-85 |
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Committee | DC |
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Conference Date | 2015/2/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Method of LFSR Seed Generation for Hierarchical BIST |
Sub Title (in English) | |
Keyword(1) | BIST |
Keyword(2) | LFSR |
Keyword(3) | seed generation |
Keyword(4) | time expansion model |
Keyword(5) | delay faults |
Keyword(6) | hierarchical BIST |
1st Author's Name | Kosuke SAWAKI |
1st Author's Affiliation | Graduate School of Engineering, Oita University() |
2nd Author's Name | Satoshi OHTAKE |
2nd Author's Affiliation | Faculty of Engineering, Oita University |
Date | 2015-02-13 |
Paper # | DC2014-85 |
Volume (vol) | vol.114 |
Number (no) | 446 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |