Presentation 2015-02-13
A Method of LFSR Seed Generation for Hierarchical BIST
Kosuke SAWAKI, Satoshi OHTAKE,
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Abstract(in English) A linear feedback shift register (LFSR) is used as a test pattern generator of built-in self-test (BIST). In BIST, although pseudo-random patterns generated by the LFSR are applied to a circuit under test (CUT) as test patterns, reseeding, which replaces the seed of the LFSR, is used to detect random pattern resistant faults (RPRFs). In general, a seed that when expanded by the LFSR will produce a test pattern for an RPRF is used for reseeding. So far, we have proposed a one-pass seed generation method for generating such a seed for scan based BIST. In this paper, we employ the concept of the one-pass seed generation for hierarchical BIST methods utilizing register-transfer level (RTL) information. The proposed method can identify untestable faults under the BIST environment and guarantees to generate seeds for detectable faults. In our experiments for several RTL benchmark circuits, we show that fault coverage can be improved by using the generated seeds for RPRFs of the circuits.
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Keyword(in English) BIST / LFSR / seed generation / time expansion model / delay faults / hierarchical BIST
Paper # DC2014-85
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Committee DC
Conference Date 2015/2/6(1days)
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Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Method of LFSR Seed Generation for Hierarchical BIST
Sub Title (in English)
Keyword(1) BIST
Keyword(2) LFSR
Keyword(3) seed generation
Keyword(4) time expansion model
Keyword(5) delay faults
Keyword(6) hierarchical BIST
1st Author's Name Kosuke SAWAKI
1st Author's Affiliation Graduate School of Engineering, Oita University()
2nd Author's Name Satoshi OHTAKE
2nd Author's Affiliation Faculty of Engineering, Oita University
Date 2015-02-13
Paper # DC2014-85
Volume (vol) vol.114
Number (no) 446
Page pp.pp.-
#Pages 6
Date of Issue