| Presentation | 2015-02-13 Report on International Test Conference Asian Sub-Committee ITC, Shinichi Wakana, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The Summary of International Test Conference held on Oct. at Seattle 2014 will be reported. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | International Test Conference / Test / Analysis / LSI,/Circuit Design |
| Paper # | DC2014-83 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2015/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Report on International Test Conference |
| Sub Title (in English) | |
| Keyword(1) | International Test Conference |
| Keyword(2) | Test |
| Keyword(3) | Analysis |
| Keyword(4) | LSI,/Circuit Design |
| 1st Author's Name | Asian Sub-Committee ITC |
| 1st Author's Affiliation | () |
| 2nd Author's Name | Shinichi Wakana |
| 2nd Author's Affiliation | FUJITSU LABORATORIES LTD. |
| Date | 2015-02-13 |
| Paper # | DC2014-83 |
| Volume (vol) | vol.114 |
| Number (no) | 446 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |