Presentation 2015-02-13
Test Method for Encryption LSI against Scan-based Attacks
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Abstract(in English) Recently, encryption LSIs are embedded in a variety of digital products for security and copyright protection. Most LSI including encryption LSI has scan chains for a manufacturing test. However, there is a risk that the secret information is leaked through scan chains by scan-based attacks. In this paper, we propose a test method which consists of a Design-for-Testability(DFT) method and a test pattern generation method. The DFT method adds observability to all state resisters in controller parts in encryption LSIs. The test pattern generation method consists of two parts. One part is a test pattern generation method for state-observable FSMs for controller parts of encryption LSIs. The other one is a test pattern generation method using functional time expansion model for datapath parts of encryption LSIs. If attackers leak the circuit structure implemented DES and the proposed countermeasure against scan-based attack, attackers cannot obtain the secret information by scan-based attack. We evaluate the testabiltiy of the proposed method on encryption LSI implemented DES. The proposed test method can achieve from 99.10% to 100 % of high test coverage with preventing scan based attack.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Scan Design / Scan-based Attack / Encryption LSI / State-Observable FSM / Functional Time Expansion Model
Paper # DC2014-82
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Committee DC
Conference Date 2015/2/6(1days)
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Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Test Method for Encryption LSI against Scan-based Attacks
Sub Title (in English)
Keyword(1) Scan Design
Keyword(2) Scan-based Attack
Keyword(3) Encryption LSI
Keyword(4) State-Observable FSM
Keyword(5) Functional Time Expansion Model
1st Author's Name MasayoshiG YOSHIMUA
1st Author's Affiliation Faculty of Computer Science and Engineering, Kyoto Sangyo University()
2nd Author's Name Jun NISHIMAKI
2nd Author's Affiliation Graduate School of Industrial Technology, Nihon University
3rd Author's Name Toshinori HOSOKAWA
3rd Author's Affiliation College of Industrial Technology, Nihon University
Date 2015-02-13
Paper # DC2014-82
Volume (vol) vol.114
Number (no) 446
Page pp.pp.-
#Pages 6
Date of Issue