Presentation | 2015-01-29 Analysis of Relation between Performance and Reliability of NAND Flash memory/Storage-class memory Hybrid SSD Hirofumi TAKISHITA, Shuhei TANAKAMARU, Shogo HOSAKA, Koh JOHGUCHI, Ken TAKEUCHI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The Performance of NAND flash memory changes during write/erase cycling. This paper evaluates the performance of NAND-only solid-state drives (SSDs) and NAND flash memory/storage-class memory (SCM) hybrid SSDs with various applications when of the strength of the error-correcting code (ECC) is adjusted to NAND's reliability. Moreover, in every application, the required SCM reliability is analyzed. The acceptable BER of SCM can be 1% at maximum. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | NAND flash memory / SCM / SSD / ECC / reliability |
Paper # | ICD2014-111 |
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Committee | ICD |
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Conference Date | 2015/1/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of Relation between Performance and Reliability of NAND Flash memory/Storage-class memory Hybrid SSD |
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Keyword(1) | NAND flash memory |
Keyword(2) | SCM |
Keyword(3) | SSD |
Keyword(4) | ECC |
Keyword(5) | reliability |
1st Author's Name | Hirofumi TAKISHITA |
1st Author's Affiliation | Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University() |
2nd Author's Name | Shuhei TANAKAMARU |
2nd Author's Affiliation | Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University:Department of Electrical Engineering and Information Systems, Graduate School of Engineering University of Tokyo |
3rd Author's Name | Shogo HOSAKA |
3rd Author's Affiliation | Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University |
4th Author's Name | Koh JOHGUCHI |
4th Author's Affiliation | Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University |
5th Author's Name | Ken TAKEUCHI |
5th Author's Affiliation | Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University |
Date | 2015-01-29 |
Paper # | ICD2014-111 |
Volume (vol) | vol.114 |
Number (no) | 436 |
Page | pp.pp.- |
#Pages | 6 |
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