Presentation 2015-01-29
Analysis of Relation between Performance and Reliability of NAND Flash memory/Storage-class memory Hybrid SSD
Hirofumi TAKISHITA, Shuhei TANAKAMARU, Shogo HOSAKA, Koh JOHGUCHI, Ken TAKEUCHI,
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Abstract(in English) The Performance of NAND flash memory changes during write/erase cycling. This paper evaluates the performance of NAND-only solid-state drives (SSDs) and NAND flash memory/storage-class memory (SCM) hybrid SSDs with various applications when of the strength of the error-correcting code (ECC) is adjusted to NAND's reliability. Moreover, in every application, the required SCM reliability is analyzed. The acceptable BER of SCM can be 1% at maximum.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) NAND flash memory / SCM / SSD / ECC / reliability
Paper # ICD2014-111
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Committee ICD
Conference Date 2015/1/22(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of Relation between Performance and Reliability of NAND Flash memory/Storage-class memory Hybrid SSD
Sub Title (in English)
Keyword(1) NAND flash memory
Keyword(2) SCM
Keyword(3) SSD
Keyword(4) ECC
Keyword(5) reliability
1st Author's Name Hirofumi TAKISHITA
1st Author's Affiliation Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University()
2nd Author's Name Shuhei TANAKAMARU
2nd Author's Affiliation Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University:Department of Electrical Engineering and Information Systems, Graduate School of Engineering University of Tokyo
3rd Author's Name Shogo HOSAKA
3rd Author's Affiliation Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University
4th Author's Name Koh JOHGUCHI
4th Author's Affiliation Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University
5th Author's Name Ken TAKEUCHI
5th Author's Affiliation Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University
Date 2015-01-29
Paper # ICD2014-111
Volume (vol) vol.114
Number (no) 436
Page pp.pp.-
#Pages 6
Date of Issue