Presentation | 2015-01-29 Temperature sensor applying Body Bias in Silicon-on-Thin-BOX Tsubasa KOSAKA, Shohei NAKAMURA, Kimiyoshi USAMI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The performance advancement by the transistor scaling is blocked by increase of power consumption and process variation. Silicon on Thin BOX(SOTB) solve these problems. In addition, there is a problem that the temperature changes in a transistor. The temperature change causes deterioration and the trouble of the transistor and causes malfunction of the chip. The temperature sensor which measures the temperature in the chip is necessary. In this paper, a temperature sensor for SOTB is proposed. We demonstrate that the temperature sensor for SOTB enables us to achieve high precision of the thermometry and mitigate the process variation at every chip by Body Bias than a conventional bulk transistor. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Silicon-on-Thin-BOX MOSFET / Body Bias / Temperature sensor / Leakage monitor / Process variation |
Paper # | VLD2014-127,CPSY2014-136,RECONF2014-60 |
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Conference Information | |
Committee | RECONF |
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Conference Date | 2015/1/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Reconfigurable Systems (RECONF) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Temperature sensor applying Body Bias in Silicon-on-Thin-BOX |
Sub Title (in English) | |
Keyword(1) | Silicon-on-Thin-BOX MOSFET |
Keyword(2) | Body Bias |
Keyword(3) | Temperature sensor |
Keyword(4) | Leakage monitor |
Keyword(5) | Process variation |
1st Author's Name | Tsubasa KOSAKA |
1st Author's Affiliation | Graduate School of Engineering and Science,Shibaura Institute of Technology() |
2nd Author's Name | Shohei NAKAMURA |
2nd Author's Affiliation | Graduate School of Engineering and Science,Shibaura Institute of Technology |
3rd Author's Name | Kimiyoshi USAMI |
3rd Author's Affiliation | Department of Information Science and Engineering, Shibaura Institute of Technology |
Date | 2015-01-29 |
Paper # | VLD2014-127,CPSY2014-136,RECONF2014-60 |
Volume (vol) | vol.114 |
Number (no) | 428 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |