| Presentation | 2015-01-23 Study on Detection Method for Clock Error due to Intentional Electromagnetic Interference Atsushi Nagao, Yuichiro Okugawa, Kazuhiro Takaya, Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Overclocking, which occurs because of the disruption of the clock frequency, causes LSI modules to malfunction. The Electromagnetic interference can also cause an LSI module to malfunction owing to overclocking. On the other hand, the clarification of malfunction factors is required to increase the immunity of LSI modules. With that, this paper proposes a method for detecting overclocking when electromagnetic interference is applied; the presence of overclocking is determined based on the output results from an evaluation circuit, which is installed in an LSI module. Further, experiments were conducted for a case in which glitches were introduced into the clock signal and another case where a continuous wave was applied, to examine the validity of the proposed method. As a result, we confirm that the evaluation circuit can correctly determine if overclocking is occurred or not. In addition, we confirm the outputs of the evaluation circuit that indicated the occurrence of overclocking when a continuous wave was injected. And, the change of the clock cycle was confirmed by fluctuation in voltage which is occurred by overlapping CW from observation of clock signal. Therefore, the evaluation circuit proposed in this paper was confirmed to be useful in detecting the overclocking. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LSI module / Intentional electromagnetic interference / Overclocking / Glitch / Continuous wave |
| Paper # | EMCJ2014-100 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2015/1/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on Detection Method for Clock Error due to Intentional Electromagnetic Interference |
| Sub Title (in English) | |
| Keyword(1) | LSI module |
| Keyword(2) | Intentional electromagnetic interference |
| Keyword(3) | Overclocking |
| Keyword(4) | Glitch |
| Keyword(5) | Continuous wave |
| 1st Author's Name | Atsushi Nagao |
| 1st Author's Affiliation | NTT Energy and Environment Systems Laboratories() |
| 2nd Author's Name | Yuichiro Okugawa |
| 2nd Author's Affiliation | NTT Energy and Environment Systems Laboratories |
| 3rd Author's Name | Kazuhiro Takaya |
| 3rd Author's Affiliation | Tohoku University |
| 4th Author's Name | Yu-ichi Hayashi |
| 4th Author's Affiliation | Tohoku University |
| 5th Author's Name | Naofumi Homma |
| 5th Author's Affiliation | Tohoku University |
| 6th Author's Name | Takafumi Aoki |
| 6th Author's Affiliation | Tohoku University |
| Date | 2015-01-23 |
| Paper # | EMCJ2014-100 |
| Volume (vol) | vol.114 |
| Number (no) | 398 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |