Presentation 2014-12-12
Evaluation of Photoconductivities of n-ch, p-ch, pin-ch poly-Si TFPTs
Takahiro FUCHIYA, Yoshiharu MAEDA, Takayuki KADONOME, Takumi TANAKA, Tokiyoshi MATSUDA, Mutsumi KIMURA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have evaluated photoconductivities of n-ch, p-ch, and pin-ch poly-Si TFPTs for photosensor application. It was observed that the photo-induced electric current is: pin-ch with the gate terminal connected to n-region > n-ch > pin-ch with the gate terminal connected to p-region > p-ch. Moreover, we have analyzed electron density (n), hole density (p), and recombination rate of the n-ch, p-ch, and pin-ch poly-Si TFPTs using device simulation. It was suggested that the difference of photo-induced electric current is caused by the difference of the recombination rate.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) n-ch / p-ch / pin-ch / poly-Si / TFPT / Photo-induced electric current / Device simulation / Recombination rate
Paper # EID2014-21,SDM2014-116
Date of Issue

Conference Information
Committee EID
Conference Date 2014/12/5(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electronic Information Displays (EID)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of Photoconductivities of n-ch, p-ch, pin-ch poly-Si TFPTs
Sub Title (in English)
Keyword(1) n-ch
Keyword(2) p-ch
Keyword(3) pin-ch
Keyword(4) poly-Si
Keyword(5) TFPT
Keyword(6) Photo-induced electric current
Keyword(7) Device simulation
Keyword(8) Recombination rate
1st Author's Name Takahiro FUCHIYA
1st Author's Affiliation ()
2nd Author's Name Yoshiharu MAEDA
2nd Author's Affiliation / Department of Electronics and Informatics, Ryukoku University
3rd Author's Name Takayuki KADONOME
3rd Author's Affiliation Department of Electronics and Informatics, Ryukoku University
4th Author's Name Takumi TANAKA
4th Author's Affiliation Department of Electronics and Informatics, Ryukoku University
5th Author's Name Tokiyoshi MATSUDA
5th Author's Affiliation Department of Electronics and Informatics, Ryukoku University
6th Author's Name Mutsumi KIMURA
6th Author's Affiliation
Date 2014-12-12
Paper # EID2014-21,SDM2014-116
Volume (vol) vol.114
Number (no) 359
Page pp.pp.-
#Pages 4
Date of Issue