Presentation | 2014-12-12 Conduction mechanism and Charge retention mechanism for DNA memory transistor Shouhei Nakamura, Naoto MATSUO, Akira HEYA, Kazushige YAMANA, Tadao TAKADA, Masataka FUKUYAMA, Shin YOKOYAMA, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The carrier behavior in DNA was examined using the DNA channel/SiO_2/Si gate structure, hi this case, electrodes with a gap of 120 nm using a substrate Si was prepared and DNA was fixed between the electrodes. The dI_D/dV_D shows the maximum value at the drain voltage of 0.7 V. This phenomenon relates to the trapped and detrapped electrons in DNA. The electrons were trapped by guanine-base, and they were detrapped by the electric field in the channel. In the case of p^+Si, the holes of majority earners are emitted from the drain electrodes by recombination of electrons and holes in the DNA channel thought the mass action law. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | DNA / FET / Si / Trap / Detrap / Carrier / Charge retention property |
Paper # | EID2014-16,SDM2014-111 |
Date of Issue |
Conference Information | |
Committee | EID |
---|---|
Conference Date | 2014/12/5(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Electronic Information Displays (EID) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Conduction mechanism and Charge retention mechanism for DNA memory transistor |
Sub Title (in English) | |
Keyword(1) | DNA |
Keyword(2) | FET |
Keyword(3) | Si |
Keyword(4) | Trap |
Keyword(5) | Detrap |
Keyword(6) | Carrier |
Keyword(7) | Charge retention property |
1st Author's Name | Shouhei Nakamura |
1st Author's Affiliation | University of Hyogo() |
2nd Author's Name | Naoto MATSUO |
2nd Author's Affiliation | University of Hyogo |
3rd Author's Name | Akira HEYA |
3rd Author's Affiliation | University of Hyogo |
4th Author's Name | Kazushige YAMANA |
4th Author's Affiliation | University of Hyogo |
5th Author's Name | Tadao TAKADA |
5th Author's Affiliation | University of Hyogo |
6th Author's Name | Masataka FUKUYAMA |
6th Author's Affiliation | Research Institute for Nanodevice and Bio Systems, Hiroshima University |
7th Author's Name | Shin YOKOYAMA |
7th Author's Affiliation | Research Institute for Nanodevice and Bio Systems, Hiroshima University |
Date | 2014-12-12 |
Paper # | EID2014-16,SDM2014-111 |
Volume (vol) | vol.114 |
Number (no) | 359 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |