Presentation | 2014-12-12 Impacts of Orientation and Cross-sectional Shape on Mobility of P-channel Si Nanowire MOSFETs Hiroaki FUJIHARA, Naoya MORIOKA, Hajime TANAKA, Jun SUDA, Tsunenobu KIMOTO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We fabricated <100>, <110>, <111>, and <112> p-channel Gate-Ail-Around Si nanowire (SiNW) MOSFETs with rectangular cross sections with various width, and investigated the hole mobility of the SiNW MOSFETs using the double Lm method. Measured hole mobilities of SiNW MOSFETs were about 80-140 cm^2/Vs at n_ |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Si Nanowire / MOSFET / Hole Mobility / Effective Mass |
Paper # | EID2014-14,SDM2014-109 |
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Committee | EID |
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Conference Date | 2014/12/5(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Impacts of Orientation and Cross-sectional Shape on Mobility of P-channel Si Nanowire MOSFETs |
Sub Title (in English) | |
Keyword(1) | Si Nanowire |
Keyword(2) | MOSFET |
Keyword(3) | Hole Mobility |
Keyword(4) | Effective Mass |
1st Author's Name | Hiroaki FUJIHARA |
1st Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University() |
2nd Author's Name | Naoya MORIOKA |
2nd Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
3rd Author's Name | Hajime TANAKA |
3rd Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
4th Author's Name | Jun SUDA |
4th Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
5th Author's Name | Tsunenobu KIMOTO |
5th Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
Date | 2014-12-12 |
Paper # | EID2014-14,SDM2014-109 |
Volume (vol) | vol.114 |
Number (no) | 359 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |