| Presentation | 2014-12-19 Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism : The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota, Koichiro Sawa, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mechanism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed another mechanism, namely a micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on sliding amplitude, and smaller sized system constituted of commercial parts. In this paper, they obtain the experimental results of minimal sliding amplitudes to make resistances fluctuate on electrical contacts under some conditions which are three types of input waveforms which are sinusoidal, rectangular, and impulsive, three levels of frictional force which are usual (1.6N/pin), middle (1.0N/pin), and smaller (0.3N/pin) between a male-pin and a female-part using the MSM2. In addition, they compare the differences on the minimal sliding amplitudes among the above conditions by means of dispersion analysis on statistical test on the degradation phenomenon of electrical contacts. Consequently they obtain that the larger the frictional force is the larger the minimal sliding amplitude is, and they also obtain that the amplitudes are larger in sinusoidal input than in rectangular one and are larger in rectangular input than in impulsive one. |
| Keyword(in Japanese) | (See Japanese page) |
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| Paper # | EMD2014-96 |
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| Committee | EMD |
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| Conference Date | 2014/12/12(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electromechanical Devices (EMD) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism : The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) |
| Sub Title (in English) | |
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| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | RD Department Marketing Research Headquarters TMC System Co. Ltd.() |
| 2nd Author's Name | Keiji Koshida |
| 2nd Author's Affiliation | RD Department Marketing Research Headquarters TMC System Co. Ltd. |
| 3rd Author's Name | Hiroaki Kubota |
| 3rd Author's Affiliation | RD Department Marketing Research Headquarters TMC System Co. Ltd. |
| 4th Author's Name | Koichiro Sawa |
| 4th Author's Affiliation | Faculty of Engineering Nippon Institute of Thechnology |
| Date | 2014-12-19 |
| Paper # | EMD2014-96 |
| Volume (vol) | vol.114 |
| Number (no) | 382 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |