| Presentation | 2014-12-02 Uniqueness Evaluation of a Current Mismatch type ID Generation Circuit Kenichi Matsunaga, Shoichi Oshima, Tadashi Minotani, Toshihiko Kondo, Hiroki Morimura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a low-power and uniquely-distributed ID-generation circuit using process variation. Developed circuit utilizes current mismatch in NMOS pair for unique ID output. In order to evaluate the output 1/0 probability-uniformity and process dependence, the prototype was fabricated in two different 0.18-μm standard CMOS technology. 382 chips were tested and the hamming distances between each chip were calculated. The result shows the circuit architecture generates unique and process-independent ID. Furthermore, the bit-generation efficiency was found to be 0.96 pJ/bit. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ID generation / Mismatch / Hamming distance / Uniqueness / Binominal distribution / PUF |
| Paper # | ICD2014-108,CPSY2014-120 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2014/11/24(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Uniqueness Evaluation of a Current Mismatch type ID Generation Circuit |
| Sub Title (in English) | |
| Keyword(1) | ID generation |
| Keyword(2) | Mismatch |
| Keyword(3) | Hamming distance |
| Keyword(4) | Uniqueness |
| Keyword(5) | Binominal distribution |
| Keyword(6) | PUF |
| 1st Author's Name | Kenichi Matsunaga |
| 1st Author's Affiliation | NTT Device Technology Laboratories() |
| 2nd Author's Name | Shoichi Oshima |
| 2nd Author's Affiliation | NTT Device Technology Laboratories |
| 3rd Author's Name | Tadashi Minotani |
| 3rd Author's Affiliation | NTT TELECON |
| 4th Author's Name | Toshihiko Kondo |
| 4th Author's Affiliation | NTT Device Technology Laboratories |
| 5th Author's Name | Hiroki Morimura |
| 5th Author's Affiliation | NTT TELECON |
| Date | 2014-12-02 |
| Paper # | ICD2014-108,CPSY2014-120 |
| Volume (vol) | vol.114 |
| Number (no) | 345 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |