Presentation 2014-12-19
Studies on Reliability Evaluation Techniques for Triple Register Circuits
Naoki MIDORIKAWA, Muneyuki NAKAMURA, Aromhack SAYSANASONGKHAM, Kazuya SAKAI, Satoshi FUKUMOTO,
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Abstract(in English) This paper discusses the reliability evaluation technique for the triple register circuit which our research group had proposed. We firstly describe the summary of the triple register circuit. Secondary, the evaluation model by discrete time Markov chain is explained for calculating the numerical results within the practical time cost. Thus, we present the simulation on the basis of circuit information about the combinational circuit block in the target sequential one to estimate the transition probabilities of the Markov chain.
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Keyword(in English) transient fault / triple register circuit / reliability evaluation
Paper # DC2014-72
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Committee DC
Conference Date 2014/12/12(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Studies on Reliability Evaluation Techniques for Triple Register Circuits
Sub Title (in English)
Keyword(1) transient fault
Keyword(2) triple register circuit
Keyword(3) reliability evaluation
1st Author's Name Naoki MIDORIKAWA
1st Author's Affiliation Faculty of System Design, Tokyo Metropolitan University()
2nd Author's Name Muneyuki NAKAMURA
2nd Author's Affiliation Faculty of System Design, Tokyo Metropolitan University
3rd Author's Name Aromhack SAYSANASONGKHAM
3rd Author's Affiliation Faculty of System Design, Tokyo Metropolitan University
4th Author's Name Kazuya SAKAI
4th Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
5th Author's Name Satoshi FUKUMOTO
5th Author's Affiliation Faculty of System Design, Tokyo Metropolitan University
Date 2014-12-19
Paper # DC2014-72
Volume (vol) vol.114
Number (no) 384
Page pp.pp.-
#Pages 4
Date of Issue