Presentation 2014-12-19
Reliability of ECC-based Memory Architectures with Online Self-repair Capabilities
Gian MAYUGA, Yuta YAMATO, Tomokazu YONEDA, Yasuo SATO, Michiko INOUE,
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Abstract(in English) Embedded memory is extensively being used in SoCs, and is rapidly growing in size and density. To keep up with the development pace of nanoscale devices, enhancement methods for yields and reliability must overcome the barriers set forth by advent of new technology. To address the issue of reliability, periodic online field test and repair are implemented by using synergistic approach of employing redundancy and ECC to repair or correct both hard erros and soft erros. In this paper, an online remap strategy for memory repair, which ensures 'fresh' memory words are always used until the spare words run out, is proposed, and the improvement of reliability for memory architectures using the proposed scheme is demonstrated.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) memory repair / built-in self-repair / ECC / online repair / remapping / remap CAM / reliability
Paper # DC2014-70
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Committee DC
Conference Date 2014/12/12(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Reliability of ECC-based Memory Architectures with Online Self-repair Capabilities
Sub Title (in English)
Keyword(1) memory repair
Keyword(2) built-in self-repair
Keyword(3) ECC
Keyword(4) online repair
Keyword(5) remapping
Keyword(6) remap CAM
Keyword(7) reliability
1st Author's Name Gian MAYUGA
1st Author's Affiliation Nara Institute of Science and Technology Information Science()
2nd Author's Name Yuta YAMATO
2nd Author's Affiliation Nara Institute of Science and Technology Information Science
3rd Author's Name Tomokazu YONEDA
3rd Author's Affiliation Nara Institute of Science and Technology Information Science
4th Author's Name Yasuo SATO
4th Author's Affiliation Kyushu Institute of Technology
5th Author's Name Michiko INOUE
5th Author's Affiliation Nara Institute of Science and Technology Information Science
Date 2014-12-19
Paper # DC2014-70
Volume (vol) vol.114
Number (no) 384
Page pp.pp.-
#Pages 6
Date of Issue