Presentation	2014-12-19 Study on reduction and control of NBTI-induced degradation in FPGA-based ring oscillators Yasuo SATO, Yousuke MIYAKE, Seiji KAJIHARA,
PDF Download Page	PDF download Page Link
Abstract(in Japanese)	(See Japanese page)
Abstract(in English)	Ring oscillators are used for variety of applications to enhance reliability on LSIs or FPGAs; however, the performance degradation caused by physial aging phenomena such as NBTI is becoming a crucial issue. This paper proposes a design technology that reduces or controls the degradation of ring oscillators. The input values of look-up tables that constitute the oscillators are properly controlled during the off-state while the oscillator is not working. Further, the relation of the degradation amounts is discussed by comparing frequencies of plural oscillators.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	FPGA / NBTI / Degradation / Ring Oscillator / LUT
Paper #	DC2014-67
Date of Issue

Conference Information
Committee	DC
Conference Date	2014/12/12(1days)
Place (in Japanese)	(See Japanese page)
Place (in English)
Topics (in Japanese)	(See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To	Dependable Computing (DC)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Study on reduction and control of NBTI-induced degradation in FPGA-based ring oscillators
Sub Title (in English)
Keyword(1)	FPGA
Keyword(2)	NBTI
Keyword(3)	Degradation
Keyword(4)	Ring Oscillator
Keyword(5)	LUT
1st Author's Name	Yasuo SATO
1st Author's Affiliation	Kyushu Institute of Technology()
2nd Author's Name	Yousuke MIYAKE
2nd Author's Affiliation	Kyushu Institute of Technology
3rd Author's Name	Seiji KAJIHARA
3rd Author's Affiliation	Kyushu Institute of Technology
Date	2014-12-19
Paper #	DC2014-67
Volume (vol)	vol.114
Number (no)	384
Page	pp.pp.-
#Pages	6
Date of Issue