Presentation | 2014-12-19 Study on reduction and control of NBTI-induced degradation in FPGA-based ring oscillators Yasuo SATO, Yousuke MIYAKE, Seiji KAJIHARA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Ring oscillators are used for variety of applications to enhance reliability on LSIs or FPGAs; however, the performance degradation caused by physial aging phenomena such as NBTI is becoming a crucial issue. This paper proposes a design technology that reduces or controls the degradation of ring oscillators. The input values of look-up tables that constitute the oscillators are properly controlled during the off-state while the oscillator is not working. Further, the relation of the degradation amounts is discussed by comparing frequencies of plural oscillators. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | FPGA / NBTI / Degradation / Ring Oscillator / LUT |
Paper # | DC2014-67 |
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Committee | DC |
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Conference Date | 2014/12/12(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Study on reduction and control of NBTI-induced degradation in FPGA-based ring oscillators |
Sub Title (in English) | |
Keyword(1) | FPGA |
Keyword(2) | NBTI |
Keyword(3) | Degradation |
Keyword(4) | Ring Oscillator |
Keyword(5) | LUT |
1st Author's Name | Yasuo SATO |
1st Author's Affiliation | Kyushu Institute of Technology() |
2nd Author's Name | Yousuke MIYAKE |
2nd Author's Affiliation | Kyushu Institute of Technology |
3rd Author's Name | Seiji KAJIHARA |
3rd Author's Affiliation | Kyushu Institute of Technology |
Date | 2014-12-19 |
Paper # | DC2014-67 |
Volume (vol) | vol.114 |
Number (no) | 384 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |