Presentation 2014-11-25
Study on PZT thin films for ultra-high density ferroelectric data storage based on scanning nonlinear dielectric microscopy
Yitong CHEN, Yoshiomi HIRANAGA, Yasuo CHO,
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Abstract(in English) Lead zirconate titanate ( Pb(Zr,Ti)O_3:PZT) thin film is one of the promising candidate ferroelectrics for the next generation high density ferroelectric data storage based on scanning nonlinear dielectric microscopy(SNDM). Its very large nonlinear dielectric constants enables us to achieve high speed reading. To use this advantage, high quality PZT thin film with high polarization switching speed of very small nano-domain dots is required. In this paper, we describe the fabrication method for high quality PZT film using Radio-frequency magnetron sputtering equipment. We investigated the quality of the films as functions of the amount of Pb and the thickness of film. The properties of these films are measured and discussed.
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Keyword(in English) ferroelectric data record / PZT film / scanning nonlinear dielectric microscopy
Paper # MR2014-26
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Committee MR
Conference Date 2014/11/18(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
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Title (in English) Study on PZT thin films for ultra-high density ferroelectric data storage based on scanning nonlinear dielectric microscopy
Sub Title (in English)
Keyword(1) ferroelectric data record
Keyword(2) PZT film
Keyword(3) scanning nonlinear dielectric microscopy
1st Author's Name Yitong CHEN
1st Author's Affiliation Research Institute of Electrical Communication, Tohoku University()
2nd Author's Name Yoshiomi HIRANAGA
2nd Author's Affiliation Research Institute of Electrical Communication, Tohoku University
3rd Author's Name Yasuo CHO
3rd Author's Affiliation Research Institute of Electrical Communication, Tohoku University
Date 2014-11-25
Paper # MR2014-26
Volume (vol) vol.114
Number (no) 327
Page pp.pp.-
#Pages 6
Date of Issue