Presentation 2014/11/19
An efficient calculation of RTN-induced SRAM failure probability
Hiromitsu AWANO, Masayuki HIROMOTO, Takashi SATO,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Failure rate degradation of an SRAM cell due to random telegraph noise (RTN) is calculated for the first time. An efficient calculation method of RTN-induced SRAM failure probability has been developed to exhaustively cover a large number of possible bias-voltage combinations on which RTN statistics strongly depend. In order to shorten computational time, the Monte Carlo calculation of a single gate-bias condition is accelerated by incorporating two techniques: 1) construction of an optimal importance sampling using particles that move about the "important" regions in a variability space, and 2) a classifier that quickly judges whether the random samples are in failure regions or not. We show that the proposed method achieves at least 15.6× speed-up over the state-of-the-art method. We then integrate an RTN model to modulate failure probability. In our experiment, RTN worsens failure probability by six times than that calculated without the effect of RTN.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) random telegraph noise / SRAM / failure probability / importance sampling / Monte Carlo method
Paper # VLD2014-74,DC32014-28
Date of Issue

Conference Information
Committee DC
Conference Date 2014/11/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An efficient calculation of RTN-induced SRAM failure probability
Sub Title (in English)
Keyword(1) random telegraph noise
Keyword(2) SRAM
Keyword(3) failure probability
Keyword(4) importance sampling
Keyword(5) Monte Carlo method
1st Author's Name Hiromitsu AWANO
1st Author's Affiliation Graduate School of Informatics, Kyoto University()
2nd Author's Name Masayuki HIROMOTO
2nd Author's Affiliation Graduate School of Informatics, Kyoto University
3rd Author's Name Takashi SATO
3rd Author's Affiliation Graduate School of Informatics, Kyoto University
Date 2014/11/19
Paper # VLD2014-74,DC32014-28
Volume (vol) vol.114
Number (no) 329
Page pp.pp.-
#Pages 6
Date of Issue