Presentation 2014-11-28
An approach for 30Gb/s optical LSI volume testing
Daisuke Watanabe, Shin Masuda,
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Abstract(in English) With increasing data transmission capacity due to cloud computing, datacenters have an increased need for lower power and high-density optical communication devices for power and cost saving. Recently, many researchers have strived to realize silicon-based low-cost optical transceivers using silicon photonics technology for interconnection in datacenters. To enable high-volume testing of these low-cost optical devices, we developed an optical LSI test system as a proof-of-concept. Key technologies include high-density and high-performance optical functional devices and a device interface enabling simultaneous connection of optical and electrical interfaces. Our proposed system supports multi-channel optical bit-error-rate (BER) testing of devices with signal rates up to 30 Gb/s.
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Keyword(in English) Automated test equipment / optical interface / BER testing / optical modulator / device interface
Paper # CPM2014-129,ICD2014-72
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Committee CPM
Conference Date 2014/11/20(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An approach for 30Gb/s optical LSI volume testing
Sub Title (in English)
Keyword(1) Automated test equipment
Keyword(2) optical interface
Keyword(3) BER testing
Keyword(4) optical modulator
Keyword(5) device interface
1st Author's Name Daisuke Watanabe
1st Author's Affiliation ADVANTEST Corporation()
2nd Author's Name Shin Masuda
2nd Author's Affiliation ADVANTEST Laboratories Ltd.
Date 2014-11-28
Paper # CPM2014-129,ICD2014-72
Volume (vol) vol.114
Number (no) 332
Page pp.pp.-
#Pages 4
Date of Issue