Presentation | 2014-11-28 An approach for 30Gb/s optical LSI volume testing Daisuke Watanabe, Shin Masuda, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | With increasing data transmission capacity due to cloud computing, datacenters have an increased need for lower power and high-density optical communication devices for power and cost saving. Recently, many researchers have strived to realize silicon-based low-cost optical transceivers using silicon photonics technology for interconnection in datacenters. To enable high-volume testing of these low-cost optical devices, we developed an optical LSI test system as a proof-of-concept. Key technologies include high-density and high-performance optical functional devices and a device interface enabling simultaneous connection of optical and electrical interfaces. Our proposed system supports multi-channel optical bit-error-rate (BER) testing of devices with signal rates up to 30 Gb/s. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Automated test equipment / optical interface / BER testing / optical modulator / device interface |
Paper # | CPM2014-129,ICD2014-72 |
Date of Issue |
Conference Information | |
Committee | CPM |
---|---|
Conference Date | 2014/11/20(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Component Parts and Materials (CPM) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An approach for 30Gb/s optical LSI volume testing |
Sub Title (in English) | |
Keyword(1) | Automated test equipment |
Keyword(2) | optical interface |
Keyword(3) | BER testing |
Keyword(4) | optical modulator |
Keyword(5) | device interface |
1st Author's Name | Daisuke Watanabe |
1st Author's Affiliation | ADVANTEST Corporation() |
2nd Author's Name | Shin Masuda |
2nd Author's Affiliation | ADVANTEST Laboratories Ltd. |
Date | 2014-11-28 |
Paper # | CPM2014-129,ICD2014-72 |
Volume (vol) | vol.114 |
Number (no) | 332 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |