Presentation | 2014-11-28 A Test Point Insertion Method to Reduce Capture Power Dissipation Yoshiyasu TAKAHASHI, Hiroshi YAMAZAKI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In at-speed scan testing of deep sub-micron era, high power dissipation can occur by high launch-induced switching activity when the response to a test pattern is captured by flip-flops, resulting in excessive IR drop, which may cause significant capture-induced yield loss. It is known that test pattern manipulations methods using don't care identification and don't care filling are effective to reduce capture power dissipation. In this paper, we propose a novel control point insertion method to reduce capture power dissipation. Control points can increase the number of don't cares in high power test patterns. Experimental results show that the proposed method was effective for ISCAS'89 benchmark circuits. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | transition faults / capture power dissipation / control point insertion / don't care identification / don't care filling |
Paper # | VLD2014-99,DC2014-53 |
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Conference Information | |
Committee | VLD |
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Conference Date | 2014/11/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | VLSI Design Technologies (VLD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Test Point Insertion Method to Reduce Capture Power Dissipation |
Sub Title (in English) | |
Keyword(1) | transition faults |
Keyword(2) | capture power dissipation |
Keyword(3) | control point insertion |
Keyword(4) | don't care identification |
Keyword(5) | don't care filling |
1st Author's Name | Yoshiyasu TAKAHASHI |
1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
2nd Author's Name | Hiroshi YAMAZAKI |
2nd Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
3rd Author's Name | Toshinori HOSOKAWA |
3rd Author's Affiliation | College of Industrial Technology, Nihon University |
4th Author's Name | Masayoshi YOSHIMURA |
4th Author's Affiliation | Faculty of Computer Science and Engineering, Kyoto Sangyo University |
Date | 2014-11-28 |
Paper # | VLD2014-99,DC2014-53 |
Volume (vol) | vol.114 |
Number (no) | 328 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |