Presentation | 2014-11-26 An efficient calculation of RTN-induced SRAM failure probability Hiromitsu AWANO, Masayuki HIROMOTO, Takashi SATO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Failure rate degradation of an SRAM cell due to random telegraph noise (RTN) is calculated for the first time. An efficient calculation method of RTN-induced SRAM failure probability has been developed to exhaustively cover a large number of possible bias-voltage combinations on which RTN statistics strongly depend. In order to shorten computational time, the Monte Carlo calculation of a single gate-bias condition is accelerated by incorporating two techniques: 1) construction of an optimal importance sampling using particles that move about the "important" regions in a variability space, and 2) a classifier that quickly judges whether the random samples are in failure regions or not. We show that the proposed method achieves at least 15.6× speed-up over the state-of-the-art method. We then integrate an RTN model to modulate failure probability. In our experiment, RTN worsens failure probability by six times than that calculated without the effect of RTN. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | random telegraph noise / SRAM / failure probability / importance sampling / Monte Carlo method |
Paper # | VLD2014-74,DC2014-28 |
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Committee | VLD |
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Conference Date | 2014/11/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | VLSI Design Technologies (VLD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An efficient calculation of RTN-induced SRAM failure probability |
Sub Title (in English) | |
Keyword(1) | random telegraph noise |
Keyword(2) | SRAM |
Keyword(3) | failure probability |
Keyword(4) | importance sampling |
Keyword(5) | Monte Carlo method |
1st Author's Name | Hiromitsu AWANO |
1st Author's Affiliation | Graduate School of Informatics, Kyoto University() |
2nd Author's Name | Masayuki HIROMOTO |
2nd Author's Affiliation | Graduate School of Informatics, Kyoto University |
3rd Author's Name | Takashi SATO |
3rd Author's Affiliation | Graduate School of Informatics, Kyoto University |
Date | 2014-11-26 |
Paper # | VLD2014-74,DC2014-28 |
Volume (vol) | vol.114 |
Number (no) | 328 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |