| Presentation | 2014-10-23 Effect of Precisely Timed Intentional Electromagnetic Interference on Internal Operation in Cryptographic Device Mizuki KOBAYASHI, Yu-ichi HAYASHI, Naofumi HOMMA, Takaaki MIZUKI, Takafumi AOKI, Hideaki SONE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a new intentional electromagnetic interference (IEMI) fault-injection method that can inject transient faults timely at a distance from cryptographic operations. Such IEMI fault injection could pose severe threats to many cryptographic devices assumed that attackers cannot access them directly since it can be used for performing fault analysis. The proposed IEMI fault-injection method injects a block (i.e., period) of continuous sinusoidal waves via cables attached to cryptographic devices instead of immediate electromagnetic pulse used in the conventional methods. The injected EM waves have a temporary impact in the cryptographic module, but not in other components on the device. Another important feature of the proposed method is to employ EM information leaked from the cryptographic operations for the trigger signal of the fault injection. In this paper, we demonstrate that the proposed method can inject faults timely into the final round of an AES hardware through an experiment. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Intentional Electromagnetic Interference / Common-mode Current / Side-channel Analysis / Fault-injection Attack |
| Paper # | EMCJ2014-46,MW2014-102,EST2014-60 |
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| Committee | MW |
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| Conference Date | 2014/10/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Microwaves (MW) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Effect of Precisely Timed Intentional Electromagnetic Interference on Internal Operation in Cryptographic Device |
| Sub Title (in English) | |
| Keyword(1) | Intentional Electromagnetic Interference |
| Keyword(2) | Common-mode Current |
| Keyword(3) | Side-channel Analysis |
| Keyword(4) | Fault-injection Attack |
| 1st Author's Name | Mizuki KOBAYASHI |
| 1st Author's Affiliation | Tohoku University() |
| 2nd Author's Name | Yu-ichi HAYASHI |
| 2nd Author's Affiliation | Tohoku University |
| 3rd Author's Name | Naofumi HOMMA |
| 3rd Author's Affiliation | Tohoku University |
| 4th Author's Name | Takaaki MIZUKI |
| 4th Author's Affiliation | Tohoku University |
| 5th Author's Name | Takafumi AOKI |
| 5th Author's Affiliation | Tohoku University |
| 6th Author's Name | Hideaki SONE |
| 6th Author's Affiliation | Tohoku University |
| Date | 2014-10-23 |
| Paper # | EMCJ2014-46,MW2014-102,EST2014-60 |
| Volume (vol) | vol.114 |
| Number (no) | 267 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |