Presentation 2014-08-22
Degradation phenomenon of electrical contacts by a micro-sliding mechanism : The comparison of the evaluated minimal sliding amplitudes under some conditions (2)
Keiji KOSHIDA, Shin-ichi WADA, Hiroaki KUBOTA, Koichiro SAWA,
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Abstract(in English) Authors have developed a hammering oscillating mechanism which gives micro-oscillation to electrical contacts, and have experimented. In addition, we have developed micro-sliding mechanisms for comparisons with oscillation experiments. And we have discussed the influence of the micro-sliding or micro-oscillation on the resistance of the connector pins. It is indicated that there are minimal sliding amplitudes or driving amplitudes within 21.5 hours by the sliding experiments. In this paper, we report statistical analyses for its minimal amplitudes. Statistical analyses are carried out for the estimation of population mean values and analysis of variance.
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Keyword(in English) electrical contact / contact resistance / micro-sliding mechanism / statistics analysis / analysis of variance / point estimation / interval estimation
Paper # R2014-51,EMD2014-56,CPM2014-71,OPE2014-81,LQE2014-55
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Committee OPE
Conference Date 2014/8/14(1days)
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Registration To Optoelectronics (OPE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation phenomenon of electrical contacts by a micro-sliding mechanism : The comparison of the evaluated minimal sliding amplitudes under some conditions (2)
Sub Title (in English)
Keyword(1) electrical contact
Keyword(2) contact resistance
Keyword(3) micro-sliding mechanism
Keyword(4) statistics analysis
Keyword(5) analysis of variance
Keyword(6) point estimation
Keyword(7) interval estimation
1st Author's Name Keiji KOSHIDA
1st Author's Affiliation TMC System Co. Ltd.()
2nd Author's Name Shin-ichi WADA
2nd Author's Affiliation TMC System Co. Ltd.
3rd Author's Name Hiroaki KUBOTA
3rd Author's Affiliation TMC System Co. Ltd.
4th Author's Name Koichiro SAWA
4th Author's Affiliation Nippon Institute of Thechnology
Date 2014-08-22
Paper # R2014-51,EMD2014-56,CPM2014-71,OPE2014-81,LQE2014-55
Volume (vol) vol.114
Number (no) 186
Page pp.pp.-
#Pages 6
Date of Issue