Presentation | 2014-08-22 Degradation phenomenon of electrical contacts by a micro-sliding mechanism : The comparison of the evaluated minimal sliding amplitudes under some conditions (2) Keiji KOSHIDA, Shin-ichi WADA, Hiroaki KUBOTA, Koichiro SAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Authors have developed a hammering oscillating mechanism which gives micro-oscillation to electrical contacts, and have experimented. In addition, we have developed micro-sliding mechanisms for comparisons with oscillation experiments. And we have discussed the influence of the micro-sliding or micro-oscillation on the resistance of the connector pins. It is indicated that there are minimal sliding amplitudes or driving amplitudes within 21.5 hours by the sliding experiments. In this paper, we report statistical analyses for its minimal amplitudes. Statistical analyses are carried out for the estimation of population mean values and analysis of variance. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | electrical contact / contact resistance / micro-sliding mechanism / statistics analysis / analysis of variance / point estimation / interval estimation |
Paper # | R2014-51,EMD2014-56,CPM2014-71,OPE2014-81,LQE2014-55 |
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Committee | OPE |
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Conference Date | 2014/8/14(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Optoelectronics (OPE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Degradation phenomenon of electrical contacts by a micro-sliding mechanism : The comparison of the evaluated minimal sliding amplitudes under some conditions (2) |
Sub Title (in English) | |
Keyword(1) | electrical contact |
Keyword(2) | contact resistance |
Keyword(3) | micro-sliding mechanism |
Keyword(4) | statistics analysis |
Keyword(5) | analysis of variance |
Keyword(6) | point estimation |
Keyword(7) | interval estimation |
1st Author's Name | Keiji KOSHIDA |
1st Author's Affiliation | TMC System Co. Ltd.() |
2nd Author's Name | Shin-ichi WADA |
2nd Author's Affiliation | TMC System Co. Ltd. |
3rd Author's Name | Hiroaki KUBOTA |
3rd Author's Affiliation | TMC System Co. Ltd. |
4th Author's Name | Koichiro SAWA |
4th Author's Affiliation | Nippon Institute of Thechnology |
Date | 2014-08-22 |
Paper # | R2014-51,EMD2014-56,CPM2014-71,OPE2014-81,LQE2014-55 |
Volume (vol) | vol.114 |
Number (no) | 186 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |