Presentation 2014-07-22
Statistical Test for Randomness Based on a Chaotic Unitary Transform
Hiroki OKADA, Ken UMENO,
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Abstract(in English) There are some statistical test suites for randomness of given binary sequences, and NIST SP 800-22 is the famous one. The test suite is a statistical package consisting of 15 tests that were developed to test the randomness of (arbitrarily long) binary sequences produced by either hardware or software based cryptographic random or pseudorandom number generators. The Discrete Fourier Transform Test is one test of the package. We consider the Chaotic Unitary Transform, which is more general than the Discrete Fourier Transform, and use it to make another statistical test that focuses on detecting chaotic features as non-randomness.
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Keyword(in English) Statistical test for randamness / Chaos theory / Discrete Fourier Transform
Paper # NLP2014-42
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Committee NLP
Conference Date 2014/7/14(1days)
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Registration To Nonlinear Problems (NLP)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Statistical Test for Randomness Based on a Chaotic Unitary Transform
Sub Title (in English)
Keyword(1) Statistical test for randamness
Keyword(2) Chaos theory
Keyword(3) Discrete Fourier Transform
1st Author's Name Hiroki OKADA
1st Author's Affiliation Physical Statistics Laboratory, Department of Applied Mathematics & Physics, Graduate School of Informatics, Kyoto Univercity()
2nd Author's Name Ken UMENO
2nd Author's Affiliation Physical Statistics Laboratory, Department of Applied Mathematics & Physics, Graduate School of Informatics, Kyoto Univercity
Date 2014-07-22
Paper # NLP2014-42
Volume (vol) vol.114
Number (no) 145
Page pp.pp.-
#Pages 6
Date of Issue