Presentation | 2014-07-22 Statistical Test for Randomness Based on a Chaotic Unitary Transform Hiroki OKADA, Ken UMENO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | There are some statistical test suites for randomness of given binary sequences, and NIST SP 800-22 is the famous one. The test suite is a statistical package consisting of 15 tests that were developed to test the randomness of (arbitrarily long) binary sequences produced by either hardware or software based cryptographic random or pseudorandom number generators. The Discrete Fourier Transform Test is one test of the package. We consider the Chaotic Unitary Transform, which is more general than the Discrete Fourier Transform, and use it to make another statistical test that focuses on detecting chaotic features as non-randomness. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Statistical test for randamness / Chaos theory / Discrete Fourier Transform |
Paper # | NLP2014-42 |
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Committee | NLP |
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Conference Date | 2014/7/14(1days) |
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Registration To | Nonlinear Problems (NLP) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Statistical Test for Randomness Based on a Chaotic Unitary Transform |
Sub Title (in English) | |
Keyword(1) | Statistical test for randamness |
Keyword(2) | Chaos theory |
Keyword(3) | Discrete Fourier Transform |
1st Author's Name | Hiroki OKADA |
1st Author's Affiliation | Physical Statistics Laboratory, Department of Applied Mathematics & Physics, Graduate School of Informatics, Kyoto Univercity() |
2nd Author's Name | Ken UMENO |
2nd Author's Affiliation | Physical Statistics Laboratory, Department of Applied Mathematics & Physics, Graduate School of Informatics, Kyoto Univercity |
Date | 2014-07-22 |
Paper # | NLP2014-42 |
Volume (vol) | vol.114 |
Number (no) | 145 |
Page | pp.pp.- |
#Pages | 6 |
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