Presentation | 2014-08-05 Oxide Semiconductor-based Transistors Formed in LSI Interconnects Hiroshi SUNAMURA, Naoya FURUTAKE, Shinobu SAITO, Mitsuru NARIHIRO, Yoshihiro HAYASHI, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We report on the latest progress on our proposed new transistor technology called BEOL-FET, in which we form oxide-based transistors in LSI interconnects, aiming at compact on-chip high-voltage interface realization. NFETs using wide-gap amorphous oxide semiconductor InGaZnO (IGZO, 3.3eV) as channel, are shown to exhibit normally-off characteristics, high mobility and high on/off ratio. A lower AR_ |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | BEOL-Tr / BEOL-FET / oxide semiconductor / high-V_ |
Paper # | SDM2014-76,ICD2014-45 |
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Conference Information | |
Committee | ICD |
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Conference Date | 2014/7/28(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Oxide Semiconductor-based Transistors Formed in LSI Interconnects |
Sub Title (in English) | |
Keyword(1) | BEOL-Tr |
Keyword(2) | BEOL-FET |
Keyword(3) | oxide semiconductor |
Keyword(4) | high-V_ |
Keyword(5) | pre-driver |
Keyword(6) | IGZO |
Keyword(7) | SnO |
Keyword(8) | AR_ |
Keyword(9) | complementary |
Keyword(10) | CMOS |
1st Author's Name | Hiroshi SUNAMURA |
1st Author's Affiliation | Renesas Electronics Corporation() |
2nd Author's Name | Naoya FURUTAKE |
2nd Author's Affiliation | Renesas Electronics Corporation |
3rd Author's Name | Shinobu SAITO |
3rd Author's Affiliation | Renesas Electronics Corporation |
4th Author's Name | Mitsuru NARIHIRO |
4th Author's Affiliation | Renesas Electronics Corporation |
5th Author's Name | Yoshihiro HAYASHI |
5th Author's Affiliation | Renesas Electronics Corporation |
Date | 2014-08-05 |
Paper # | SDM2014-76,ICD2014-45 |
Volume (vol) | vol.114 |
Number (no) | 175 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |