| Presentation | 2014-08-21 Improvement of Coherence length and SNR in a 200-kHz Swept Light Source with a Wide-angle Electro-optic Scanner using KTN crystal Masahiro UENO, Seiji TOYODA, Takashi SAKAMOTO, Yuzo SASAKI, Junya KOBAYASHI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Optical coherence tomography (OCT) is an imaging technique with cell-level resolution. We have developed a light source equipped a Littman-Metcalf external cavity with KTa_<1-x>Nb_xO_3 (KTN) deflector operating 200-kHz repetition rate and reported a coherence length of 7 mm in a 100-nm scanning range centered 1.31 μm. We reported our light source has a coherence length of over 20 mm by inserting a etalon into the cavity. However, its SNR was as low as about 15 dB and wasn't a practical use level. In this paper, we describe how coherence length can be increased by using a KTN deflector that its deflection angle is widened. Experimental results confirm the improvement. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | KTN / OCT / Coherence length / SNR / Swept light source / Deflector |
| Paper # | R2014-24,EMD2014-29,CPM2014-44,OPE2014-54,LQE2014-28 |
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| Conference Information | |
| Committee | LQE |
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| Conference Date | 2014/8/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Lasers and Quantum Electronics (LQE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improvement of Coherence length and SNR in a 200-kHz Swept Light Source with a Wide-angle Electro-optic Scanner using KTN crystal |
| Sub Title (in English) | |
| Keyword(1) | KTN |
| Keyword(2) | OCT |
| Keyword(3) | Coherence length |
| Keyword(4) | SNR |
| Keyword(5) | Swept light source |
| Keyword(6) | Deflector |
| 1st Author's Name | Masahiro UENO |
| 1st Author's Affiliation | Device Innovation Center, Nippon Telegraph and Telephone Corparation() |
| 2nd Author's Name | Seiji TOYODA |
| 2nd Author's Affiliation | Device Innovation Center, Nippon Telegraph and Telephone Corparation |
| 3rd Author's Name | Takashi SAKAMOTO |
| 3rd Author's Affiliation | Device Innovation Center, Nippon Telegraph and Telephone Corparation |
| 4th Author's Name | Yuzo SASAKI |
| 4th Author's Affiliation | Device Innovation Center, Nippon Telegraph and Telephone Corparation |
| 5th Author's Name | Junya KOBAYASHI |
| 5th Author's Affiliation | Device Innovation Center, Nippon Telegraph and Telephone Corparation |
| Date | 2014-08-21 |
| Paper # | R2014-24,EMD2014-29,CPM2014-44,OPE2014-54,LQE2014-28 |
| Volume (vol) | vol.114 |
| Number (no) | 187 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |