Presentation 2013-12-11
The Process by which Faults are Injected on Smart Cards Attacked by an Electromagnetic Irradiation Experiment
Yuu TSUCHIYA, Hitoshi ONO, Tsutomu MATSUMOTO,
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Abstract(in English) Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been considered to be a security threat, and there is a need to develop a method to evaluate the security of cryptographic modules against the fault attack. In our research, we have developed an experiment environment for fault injection attack using electromagnetic irradiation to evaluate the security of cryptographic modules. This environment irradiates electromagnetic wave to a smartcard with software-implemented AES. In this paper, we show the process by which faults are injected on Smart Cards.
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Keyword(in English) Smart Card / Microcontroller / Fault Injection Attack / Electromagnetic Wave / AES / DFA / Cryptography
Paper # ISEC2013-77
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Committee ISEC
Conference Date 2013/12/4(1days)
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Registration To Information Security (ISEC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) The Process by which Faults are Injected on Smart Cards Attacked by an Electromagnetic Irradiation Experiment
Sub Title (in English)
Keyword(1) Smart Card
Keyword(2) Microcontroller
Keyword(3) Fault Injection Attack
Keyword(4) Electromagnetic Wave
Keyword(5) AES
Keyword(6) DFA
Keyword(7) Cryptography
1st Author's Name Yuu TSUCHIYA
1st Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University()
2nd Author's Name Hitoshi ONO
2nd Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University
3rd Author's Name Tsutomu MATSUMOTO
3rd Author's Affiliation Graduate School of Environment and Information Sciences, Yokohama National University
Date 2013-12-11
Paper # ISEC2013-77
Volume (vol) vol.113
Number (no) 342
Page pp.pp.-
#Pages 7
Date of Issue