| Presentation | 2013-12-13 Variable Test-Timing Generation for Built-in Self-Test on FPGA Yasuo SATO, Munehiro MATSUURA, Hitoshi ARAKAWA, Yousuke MIYAKE, Seiji KAJIHARA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper proposes a variable test-timing generation method that should be used for built-in self-test on FPGA. Application-dependent test for FPGA targets quality improvement in silicon debug or online test; however, as it requires reconfigurations for design for testability, it is difficult to test the original path delay. To tackle this problem, the authors propose a test method that measures the fastest operating speed of the circuit using variable test timing. The paper proposes a variable test-timing generation method that utilizes embedded phase-shift function of PLL. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | FPGA / Built-in Self-Test / Variable test-timing / PLL / Phase-shift |
| Paper # | DC2013-69 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2013/12/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Variable Test-Timing Generation for Built-in Self-Test on FPGA |
| Sub Title (in English) | |
| Keyword(1) | FPGA |
| Keyword(2) | Built-in Self-Test |
| Keyword(3) | Variable test-timing |
| Keyword(4) | PLL |
| Keyword(5) | Phase-shift |
| 1st Author's Name | Yasuo SATO |
| 1st Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST() |
| 2nd Author's Name | Munehiro MATSUURA |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | Hitoshi ARAKAWA |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Yousuke MIYAKE |
| 4th Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
| 5th Author's Name | Seiji KAJIHARA |
| 5th Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
| Date | 2013-12-13 |
| Paper # | DC2013-69 |
| Volume (vol) | vol.113 |
| Number (no) | 353 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |