| Presentation | 2013/12/6 Efficient Scan-Based BIST Architecture for Application-Dependent FPGA Test Keita ITO, Tomokazu YONEDA, Yuta YAMATO, Kazumi HATAYAMA, Michiko INOUE, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a scan-based BIST architecture for testing of application-dependent circuits configured on FPGA. In order to build up BIST components such as LFSR, MISR and scan chains for test points, the proposed architecture efficiently utilizes memory blocks, instead of logic elements, which are unused for application-dependent circuits. The proposed BIST architecture provides enhanced-scan functionality for test points and performs a hybrid test application of LOC and enhanced-scan to improve delay test quality. Experimental results show that the proposed BIST architecture achieves high delay test quality with efficient resource utilization. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | FPGA / BIST / delay test / DFT |
| Paper # | DC2013-67 |
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| Committee | DC |
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| Conference Date | 2013/12/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Efficient Scan-Based BIST Architecture for Application-Dependent FPGA Test |
| Sub Title (in English) | |
| Keyword(1) | FPGA |
| Keyword(2) | BIST |
| Keyword(3) | delay test |
| Keyword(4) | DFT |
| 1st Author's Name | Keita ITO |
| 1st Author's Affiliation | Nara, Institute of Science and Technolosgy:Japan Science and Technology Agency, CREST() |
| 2nd Author's Name | Tomokazu YONEDA |
| 2nd Author's Affiliation | Nara, Institute of Science and Technolosgy:Japan Science and Technology Agency, CREST |
| 3rd Author's Name | Yuta YAMATO |
| 3rd Author's Affiliation | Nara, Institute of Science and Technolosgy:Japan Science and Technology Agency, CREST |
| 4th Author's Name | Kazumi HATAYAMA |
| 4th Author's Affiliation | Nara, Institute of Science and Technolosgy:Japan Science and Technology Agency, CREST |
| 5th Author's Name | Michiko INOUE |
| 5th Author's Affiliation | Nara, Institute of Science and Technolosgy:Japan Science and Technology Agency, CREST |
| Date | 2013/12/6 |
| Paper # | DC2013-67 |
| Volume (vol) | vol.113 |
| Number (no) | 353 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |