Presentation 2013-11-29
Deep-level transient spectroscopy study on defect levels in Eu,Si-codoped GaN grown by organometallic vapor phase epitaxy
Souichirou Kuwata, Atsushi Koizumi, Yasufumi Fujiwara,
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Abstract(in English) Eu-doped GaN (GaN:Eu) is a promising material to achieve red light-emitting diodes (LEDs) based on nitride semiconductors. The successful growth of GaN:Eu by organometallic vapor phase epitaxy and room-temperature red light emission from GaN:Eu under current injection have been reported. Recently, low energy transfer efficiency of the major Eu site in GaN:Eu was reported. Therefore, it is important to improve the energy transfer efficiency from GaN host material to Eu ions to increase light output power. In the standard excitation model, Eu excitation efficiency is influenced by the electronic properties of the Eu-related traps. In this study, we investigated the electronic properties of the Eu-related traps by deep-level transient spectroscopy (DLTS). In the DLTS spectra, we found at least two peaks owing to Eu-related electron traps. The energy positions of the traps were approximately the same as those reported in photoluminescence excitation measurements.
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Keyword(in English) Eu-doped GaN / DLTS
Paper # ED2013-78,CPM2013-137,LQE2013-113
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Committee CPM
Conference Date 2013/11/21(1days)
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Language JPN
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Title (in English) Deep-level transient spectroscopy study on defect levels in Eu,Si-codoped GaN grown by organometallic vapor phase epitaxy
Sub Title (in English)
Keyword(1) Eu-doped GaN
Keyword(2) DLTS
1st Author's Name Souichirou Kuwata
1st Author's Affiliation Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University()
2nd Author's Name Atsushi Koizumi
2nd Author's Affiliation Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University
3rd Author's Name Yasufumi Fujiwara
3rd Author's Affiliation Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University
Date 2013-11-29
Paper # ED2013-78,CPM2013-137,LQE2013-113
Volume (vol) vol.113
Number (no) 330
Page pp.pp.-
#Pages 4
Date of Issue