Presentation 2014-04-18
Evaluation of voltage between signal line and ground line generated by near-EM disturbance
Atsushi Nagao, Farhan Mahmood, Yuichiro Okugawa, Shin Kanno, Kazuhiro Takaya,
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Abstract(in English) Because of the increased demand for using wireless devices near from communication equipments, establishing the RF immunity test method, which is concerned about the influence of liberated electromagnetic field to circuit board in the equipments, is required. For clarifying immunity test conditions, for using wireless devices near form communication equipments, this paper made a study of the test level and test length by using a inducted voltage between signal line and ground line of the circuit board. As a result, the calculated electric fields, by using equation which is described at CISPR35 Ed. 1.0 Annex I, became larger than experiment result in both near and far electric fields, and this paper showed the equation is effective for protecting the communication equipment. After evaluating the difference of the test length, assume the inducted voltage between signal line and ground line of the circuit board as a factor that influences to immunity test, test length should be determined as a same length of three wave length.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) RF Immunity / CISPR35 / Near field / Far field / Induction voltage
Paper # EMCJ2014-2
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Conference Information
Committee EMCJ
Conference Date 2014/4/11(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of voltage between signal line and ground line generated by near-EM disturbance
Sub Title (in English)
Keyword(1) RF Immunity
Keyword(2) CISPR35
Keyword(3) Near field
Keyword(4) Far field
Keyword(5) Induction voltage
1st Author's Name Atsushi Nagao
1st Author's Affiliation NTT Energy and Environment Systems Laboratories()
2nd Author's Name Farhan Mahmood
2nd Author's Affiliation NTT Energy and Environment Systems Laboratories
3rd Author's Name Yuichiro Okugawa
3rd Author's Affiliation NTT Energy and Environment Systems Laboratories
4th Author's Name Shin Kanno
4th Author's Affiliation NTT Energy and Environment Systems Laboratories
5th Author's Name Kazuhiro Takaya
5th Author's Affiliation NTT Energy and Environment Systems Laboratories
Date 2014-04-18
Paper # EMCJ2014-2
Volume (vol) vol.114
Number (no) 15
Page pp.pp.-
#Pages 6
Date of Issue